We always maintain a lineup of the most advanced testing equipment to enable a response to broad-based needs for semiconductor tests, which are becoming more diverse and complex.
We and our highly skilled engineers offer a satisfying and efficient testing environment that conforms to our clients' needs.
Tera Probe is constantly introducing new equipment to provide wafer testing and other services using the latest testers and probes.
Tera Probe fulfills the needs of the rapidly changing semiconductor industry through its wide range of equipment.
| category | manufacturer | model | |
|---|---|---|---|
| tester | |||
| Memory | ADVANTEST | T5333P | |
| T5375 | |||
| T5377 | |||
| T5377S | |||
| T5383 | |||
| T5385 | |||
| T5588 | |||
| Japan Engineering | Profit 2000A | ||
| SoC,Logic | ADVANTEST | T6575 | |
| T6577 | |||
| V101 | |||
| V93000 | |||
| T2000 * | |||
| Sensor | Teradyne | IP750EP | |
| IP750EMP | |||
| IP750EX | |||
| Analog | ADVANTEST | T7912 | |
| T7723 | |||
| ShibaSoku | WL25 * | ||
| Verigy | V93000RF | ||
| Trimmer | esi | model 9350 | |
| model 9275 | |||
| model 9825 | |||
| model 9850TP | |||
| model 9850TP+ | |||
| model 9830 | |||
| GSI group | M430 | ||
| M435 | |||
| M450 | |||
| M550 | |||
| light source | OYO Electric | AW1005 | |
| AW1047 | |||
| AW1050 | |||
| Actes | AIS-3070 | ||
| bake furnace | O-TEC | CS-60HDPS | |
| CS-60LDS | |||
| Espec | PVHC-332 | ||
| Defect Inspection | Olympus Medical Science | AL100 | |
| AL110 | |||
| AL200 | |||
| Olympus | AL3110 | ||
| AL3120 | |||
| Toray Engineering | Inspectra1000EX200 | ||
| Inspectra1000EXⅡU300 | |||
| Probe | Tokyo Electron | P-12XL | |
| Precio | |||
| Precio Nano | |||
| P-8 | |||
| P-8XL | |||
| TOKYO SEIMITSU | UF3000 | ||
| UF3000EX | |||
| UF200A | |||
| UF200SA | |||
| UF2000 | |||
| handler | ADVANTEST | M6300 | |
| EPSON | NS8040 | ||
| NS8080 * | |||
*Will be introduced soon.
