Tera Probe reduces test time by high parallelism testing, and provides total technical support such as test pattern conversion.
As semiconductor devices become more complex, the time and effort required for testing and quality control increase. Using the latest testers, Tera Probe provides solutions for reducing the total cost with improving throughput by high parallelism testing.
Tera Probe supports the design and development of various probe cards as well as mass-production set up by using expertise accumulated through its DRAM testing business. We can also help reduce development costs by providing card evaluation services in close collaboration with probe card manufacturers.
We offer test program cross-platform conversion for efficient debug.
We can convert test patterns provided by the customers to work with any of Tera Probe's testers.
Customers can directly log in to Tera Probe's testers over the Internet from their offices and use rental testers through remote access.
