Test Operation
Service

We provide wafer test and final test services for a wide variety of semiconductor products which demand has been increasing.
We provide our customers with security and reliability setting up the optimal test environment, such as one of the best dedicated clean room in Japan, and with have an improved efficiency of mass production with support of the skilled engineers.

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  Operation

  24 hours a day, We utilize testers*1 and probers*2 to electrically test to verify whether or not the semiconductor products meet customer’s specifications.
  We will provide a wide range of support such as suitable allocation for customers, improvement of testing efficiency, and root cause analysis.

  Our main testing

  Verification of function with electric signals; stress test with high temperature/bias to remove early failed products before shipment; and, Visual inspection

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  Our technology supporting operations

  Repair and inspection of equipment such as testers*1, probers*2, and probe cards*3 used for testing require know-how: e.g. maintenance of probe card needs advanced skill to fix a needle with a size of one-hundreds of 1mmwith tweezers to return it to the right place. Also, testing with high temperature/bias requires technical qualifications and expertise.

• *1 Tester:

  An equipment for testing electrical properties of semiconductors

• *2 Prober:

  An equipment to which a probe card is attached used in connection with a tester

• *3Probe card:

  A connecting jig (probe) used for electrical test of semiconductor chips for in wafer testing. It connects a pad (electrodes) of a semiconductor chip and a tester. A semiconductor chip is electrically tested and verified for pass/fail judgments by connecting probe to pad. Since a probe layout changes depending on a pad position of a semiconductor chip, a dedicated probe card is required for each product.